VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers (1st ed. 2017) (Communications in Computer and Information Science #711)
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- Synopsis
- This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
- Copyright:
- 2017
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9789811074707
- Related ISBNs:
- 9789811074691
- Publisher:
- Springer Singapore, Singapore
- Date of Addition:
- 11/06/18
- Copyrighted By:
- Springer Nature Singapore Pte Ltd.
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Computers and Internet
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
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