Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (2003) (Frontiers in Electronic Testing: 22B)
By: and
Sign Up Now!
Already a Member? Log In
You must be logged into UK education collection to access this title.
Learn about membership options,
or view our freely available titles.
- Synopsis
- This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
- Copyright:
- 2003
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9780306487316
- Related ISBNs:
- 9781402072352
- Publisher:
- Springer US
- Date of Addition:
- 12/09/20
- Copyrighted By:
- N/A
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Computers and Internet, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.