Design for Manufacturability and Yield for Nano-Scale CMOS (2007) (Integrated Circuits and Systems)
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- Synopsis
- This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.
- Copyright:
- 2007
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9781402051883
- Related ISBNs:
- 9781402051876
- Publisher:
- Springer Netherlands
- Date of Addition:
- 02/19/21
- Copyrighted By:
- N/A
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Computers and Internet, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
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