Scan Statistics: Methods and Applications (2009) (Statistics for Industry and Technology)
By: and and
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- Synopsis
- Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.
- Copyright:
- 2009
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9780817647490
- Related ISBNs:
- 9780817647483
- Publisher:
- Birkhäuser Boston
- Date of Addition:
- 03/13/21
- Copyrighted By:
- Birkhäuser Boston, Boston, MA
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Computers and Internet, Mathematics and Statistics, Medicine
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
- Edited by:
- Sylvan Wallenstein
- Edited by:
- Vladimir Pozdnyakov
- Edited by:
- Joseph Glaz
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