X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons (1990)
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- Synopsis
- New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.
- Copyright:
- 1990
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9783642748028
- Related ISBNs:
- 9783540512226
- Publisher:
- Springer Berlin Heidelberg
- Date of Addition:
- 08/02/22
- Copyrighted By:
- Springer-Verlag Berlin Heidelberg
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Science, Earth Sciences
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
- Foreword by:
- Andre Guinier
- Translator:
- R. Setton
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