Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (2003) (Springer Series in Advanced Microelectronics #10)
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- Synopsis
- This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.
- Copyright:
- 2003
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9783662083963
- Related ISBNs:
- 9783540434399
- Publisher:
- Springer Berlin Heidelberg
- Date of Addition:
- 08/08/22
- Copyrighted By:
- N/A
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
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