Noncontact Atomic Force Microscopy: Volume 2 (2009) (NanoScience and Technology)
By: and and
Sign Up Now!
Already a Member? Log In
You must be logged into UK education collection to access this title.
Learn about membership options,
or view our freely available titles.
- Synopsis
- Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
- Copyright:
- 2009
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9783642014956
- Related ISBNs:
- 9783642014949
- Publisher:
- Springer Berlin Heidelberg
- Date of Addition:
- 08/15/22
- Copyrighted By:
- N/A
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Science, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
- Edited by:
- Seizo Morita
- Edited by:
- Franz J. Giessibl
- Edited by:
- Roland Wiesendanger
Reviews
Other Books
- by Seizo Morita
- by Franz J. Giessibl
- by Roland Wiesendanger
- in Nonfiction
- in Science
- in Technology