Applied Scanning Probe Methods I (2004) (NanoScience and Technology)
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- Synopsis
- Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.
- Copyright:
- 2004
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9783642357923
- Related ISBNs:
- 9783540005278
- Publisher:
- Springer Berlin Heidelberg
- Date of Addition:
- 08/23/22
- Copyrighted By:
- N/A
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Science, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
- Edited by:
- Bharat Bhushan
- Edited by:
- Harald Fuchs
- Edited by:
- Sumio Hosaka