Machine Learning Support for Fault Diagnosis of System-on-Chip (1st ed. 2023)
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- Synopsis
- This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
- Copyright:
- 2023
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9783031196393
- Related ISBNs:
- 9783031196386
- Publisher:
- Springer International Publishing
- Date of Addition:
- 04/13/23
- Copyrighted By:
- The Editor
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Computers and Internet, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
- Edited by:
- Patrick Girard
- Edited by:
- Shawn Blanton
- Edited by:
- Li-C. Wang
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- by Patrick Girard
- by Shawn Blanton
- by Li-C. Wang
- in Nonfiction
- in Computers and Internet
- in Technology