Ellipsometry of Functional Organic Surfaces and Films

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Synopsis

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

Book details

Edition:
2014
Series:
Springer Series in Surface Sciences (Book 52)
Author:
Karsten Hinrichs, Klaus-Jochen Eichhorn
ISBN:
9783642401282
Related ISBNs:
9783642401275
Publisher:
Springer Berlin Heidelberg
Pages:
N/A
Reading age:
Not specified
Includes images:
Yes
Date of addition:
2019-09-30
Usage restrictions:
Copyright
Copyright date:
2014
Copyright by:
N/A 
Adult content:
No
Language:
English
Categories:
Nonfiction, Science, Technology