Electron Microscopy Principles and Fundamentals

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Synopsis

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Book details

Author:
S. Amelinckx, Dirk Van Dyck, J. Van Landuyt, Gustaaf Van Tendeloo
ISBN:
9783527614554
Related ISBNs:
9783527614561, 9783527294794
Publisher:
Wiley
Pages:
527
Reading age:
Not specified
Includes images:
No
Date of addition:
2019-12-31
Usage restrictions:
Copyright
Copyright date:
2008
Copyright by:
N/A 
Adult content:
No
Language:
English
Categories:
Nonfiction, Technology