Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM

You must be logged in to access this title.

Sign up now

Already a member? Log in

Synopsis

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Book details

Edition:
2005
Author:
R.F. Egerton
ISBN:
9780387260167
Related ISBNs:
9780387258003
Publisher:
Springer US
Pages:
N/A
Reading age:
Not specified
Includes images:
No
Date of addition:
2021-02-07
Usage restrictions:
Copyright
Copyright date:
2005
Copyright by:
N/A 
Adult content:
No
Language:
English
Categories:
Nonfiction, Science, Technology