VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

You must be logged in to access this title.

Sign up now

Already a member? Log in

Synopsis

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

Book details

Edition:
2013
Series:
Communications in Computer and Information Science (Book 382)
Author:
Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh, Manoj Singh Gaur, Mark Zwolinski
ISBN:
9783642420245
Related ISBNs:
9783642420238
Publisher:
Springer Berlin Heidelberg
Pages:
N/A
Reading age:
Not specified
Includes images:
No
Date of addition:
2022-07-13
Usage restrictions:
Copyright
Copyright date:
2013
Copyright by:
N/A 
Adult content:
No
Language:
English
Categories:
Computers and Internet, Nonfiction