Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

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Synopsis

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.

Book details

Edition:
2005
Series:
Springer Proceedings in Physics (Book 107)
Author:
A. G. Cullis, John L. Hutchison
ISBN:
9783540319153
Related ISBNs:
9783540319146
Publisher:
Springer Berlin Heidelberg
Pages:
N/A
Reading age:
Not specified
Includes images:
No
Date of addition:
2022-07-17
Usage restrictions:
Copyright
Copyright date:
2005
Copyright by:
N/A 
Adult content:
No
Language:
English
Categories:
Nonfiction, Science, Technology