Progress in Nanoscale Characterization and Manipulation

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Synopsis

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

Book details

Edition:
1st ed. 2018
Series:
Springer Tracts in Modern Physics (Book 272)
Author:
Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai
ISBN:
9789811304545
Related ISBNs:
9789811304538
Publisher:
Springer Nature Singapore
Pages:
N/A
Reading age:
Not specified
Includes images:
Yes
Date of addition:
2022-07-18
Usage restrictions:
Copyright
Copyright date:
2018
Copyright by:
Peking University Press and Springer Nature Singapore Pte Ltd. 
Adult content:
No
Language:
English
Categories:
Nonfiction, Science, Technology