Advanced Materials Characterization Basic Principles, Novel Applications, and Future Directions
Synopsis
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.Features:
Covers material characterization techniques and the development of advanced characterization technology
Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
Discusses advanced material characterization technology in the microstructural and property characterization fields
Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies
This book is aimed at graduate students and researchers in materials science and engineering.
Book details
- Series:
- Advanced Materials Processing and Manufacturing
- Author:
- Ch Sateesh Kumar, M. Muralidhar Singh, Ram Krishna
- ISBN:
- 9781000872293
- Related ISBNs:
- 9781032375106, 9781003340546, 9781032375113
- Publisher:
- CRC Press
- Pages:
- N/A
- Reading age:
- Not specified
- Includes images:
- No
- Date of addition:
- 2023-05-04
- Usage restrictions:
- Copyright
- Copyright date:
- 2023
- Copyright by:
- N/A
- Adult content:
- No
- Language:
- English
- Categories:
- Nonfiction, Science, Technology