Handbook of Silicon Carbide Materials and Devices

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Synopsis

This handbook presents the key properties of silicon carbide (SiC), the power semiconductor for the 21st century. It describes related technologies, reports the rapid developments and achievements in recent years, and discusses the remaining challenging issues in the field.
The book consists of 15 chapters, beginning with a chapter by Professor W. J. Choyke, the leading authority in the field, and is divided into four sections. The topics include presolar SiC history, vapor-liquid-solid growth, spectroscopic investigations of 3C-SiC/Si, developments and challenges in the 21st century; CVD principles and techniques, homoepitaxy of 4H-SiC, cubic SiC grown on 4H-SiC, SiC thermal oxidation processes and MOS interface, Raman scattering, NIR luminescent studies, Mueller matrix ellipsometry, Raman microscopy and imaging, 4H-SiC UV photodiodes, radiation detectors, and short wavelength and synchrotron X-ray diffraction.
This comprehensive work provides a strong contribution to the engineering, materials, and basic science knowledge of the 21st century, and will be of interest to material growers, designers, engineers, scientists, postgraduate students, and entrepreneurs.

Book details

Series:
Series in Materials Science and Engineering
Author:
Zhe Chuan Feng
ISBN:
9780429582059
Related ISBNs:
9780429198540, 9781032383576, 9780367188269
Publisher:
CRC Press
Pages:
444
Reading age:
Not specified
Includes images:
Yes
Date of addition:
2023-07-09
Usage restrictions:
Copyright
Copyright date:
2021
Copyright by:
Taylor & Francis Group, LLC 
Adult content:
No
Language:
English
Categories:
Nonfiction, Science, Technology